Talk title:

AI can find defects. Can it explain them?

Bio:

Suzanne has a physics background and an Engineering Doctorate in microelectronics testing. For over 15 years she has specialised in forensic failure analysis, helping companies uncover the root-cause of failures in microelectronics, semiconductors, MEMS, electronic packaging and interconnects. As founder of Forensic Eyes, she combines advanced materials characterisation with practical engineering to help organisations solve problems, improve reliability, prevent future failures and accelerate innovation.

Suzanne chairs the TechWorks Failure Analysis, Characterisation, Test, Yield & Reliability, FACTYR, steering group. She was the first female Chair of IMAPS-UK and now serves as a Trustee, supporting collaboration and knowledge sharing across the microelectronics community.