yieldHUB, the leading semiconductor yield management company in the UK, has published a new customer success story on Allegro MicroSystems.
It shows how Allegro’s highest-volume test floor, in the Philippines, targeted a one-percentage-point gain in overall equipment effectiveness (OEE), achieved several, and turned its biggest tester utilization loss into higher first pass yield, recovered test capacity and real savings.
The Philippines site is Allegro’s highest-volume semiconductor manufacturing plant and its only internal manufacturing operation, which makes it the one place where a change in test discipline lands directly on the company’s own cost line. Allegro’s engineers were chasing utilization losses across this high-mix, high-volume final test floor. yieldHUB Live, yieldHUB’s real-time semiconductor test floor intelligence software, went after the biggest one, and the OEE improvement came with no added test time, no new test hardware and no test program changes.
“The impact on yield was kind of a revelation to us,” said Eunice Esguerra, Section Manager, Final Test Product Engineering, Allegro MicroSystems Philippines. “We didn’t really expect it to have that much of an impact in the first pass and also the final yields. When we eventually saw the dollar value, that was a happy surprise.”
Kevin Robinson, VP Operations at yieldHUB and Co-Chair of FACTYR, said: “We don’t often get a chance to name the customer and share how much we have impacted their business. This customer success story is worth reading. It is the realization of new technology invented in yieldHUB, combined with AI, our expert domain knowledge and a passion for solving what really matters to customers.”
| Metric | Result at Allegro MicroSystems Philippines |
|---|---|
| Overall equipment effectiveness (OEE) | Several percentage points of OEE improvement against a one-point target |
| First pass yield | Increased |
| Tester capacity | Recovered, with faster semiconductor production |
| Production impact | No test program changes, no added test time, no new test hardware |
| Quality reporting | Quality deviation report closure time cut significantly |
| Engineering time | Lot comparisons that took hours now take minutes |
| Expansion | Allegro’s own team is rolling yieldHUB Live out across more testers |
For Ms Esguerra, the gains come down to acting while the lot is still running. “The alerts are the main reason we recommend yieldHUB Live,” she said. “Instead of relying on people to make every decision, it is much smarter to have automated dispositions for retest, corrective action and downtime. We measured the results and saw the gains.”
The improvement has also held, and Allegro treats yieldHUB Live as part of its operating process rather than a one-off analysis. “If you turn off yieldHUB Live monitoring, the OEE gains will gradually be lost,” Ms Esguerra added.
Download the Allegro MicroSystems semiconductor customer success story
The full customer success story reveals exactly how Allegro MicroSystems turned its biggest tester utilization loss into higher first pass yield, recovered test capacity and measurable savings, including the mechanisms behind the semiconductor OEE gain, the before-and-after financial analysis and how yieldHUB Live was deployed without disrupting production.
Running a high-volume semiconductor test floor in Asia, Europe or North America and wondering what your testers are really doing? yieldHUB evaluations run on your own testers and products, against success criteria agreed with your team.
