ZEISS: Application of Ultra-short Pulsed Lasers for Improved Microscopy Sample Preparation

The emergence of ultra-short, pulsed lasers for sample preparation opens new workflow strategies as well as challenges in knowing which approach to use.

With this in mind, we invite you to join our upcoming webinar on “Application of Ultra-Pulsed Lasers for Improved Microscopy Sample Preparation”, where we will provide an overview of different sample preparation strategies for high-resolution imaging and analysis, with application examples showcasing new capabilities enabled by a FIB-SEM with integrated fs-laser.

Speaker: Cheryl Hartfield (ZEISS Microscopy)

This session is designed for those working in Electronics Materials Characterization, Electronics Failure Analysis & Electronics Packaging, with key learnings including:

• • Introduction to cross-section techniques
  • Review of mechanical methods, BIB, FIB-SEM, ex situ USP lasers, integrated laser FIB-SEM
  • LaserFIB applications and technique comparisons