In this Synopsys webinar, presenters from SiFive will share the advantages of Synopsys Formality ECO on their overall ECO cycle which has enhanced patching capabilities and resulted in faster verification runtime leading to improved TAT.

This Synopsys webinar explains various multi-die design types, UCIe multi-die design verification challenges, and how Synopsys verification solutions helps in overcoming these challenges.

In this webinar, we will discuss the usages, key metrics and the silicon health associated with different technology choices in UCIe and how it will evolve going forward. We will also delve into the challenges and opportunities for chiplets connected through UCIe, including production test, repair and in-field silicon lifecycle management.